Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

Individual chapters can be purchased as PDF downloads

Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy is the first comprehensive treatment of the subject for over 10 years.

  • £180.00
  • Weight
    2200 g
  • ISBN

There have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS. This new information is now integrated into this thoroughly up-to-date reference volume for the benefit of researcher and practical analyst alike.

In Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy we have chosen not to include chapters on specific areas of application, since there are many reviews in the literature which meet this need. Rather the space has been devoted to all aspects of the techniques themselves. Although the overall coverage is highly integrated, the individual chapters stand alone as authoritative accounts of that particular aspect of the subject. We have also taken the opportunity, through the extensive Appendices to collect together, in one place, a great deal of practically useful reference data including web-based information. 

The authors are all internationally recognised and come from Australia, Europe, Japan and the USA.

Individual chapters can be purchased as PDF downloads

31 chapters cover the following areas;

  • Perspectives and history
  • Basic principles and spectral features
  • Instrumentation, sample handling and beam effects
  • electron transport and surface sensitivity
  • Quantification
  • Spectral interpretation and structural effects
  • Depth profiling
  • Imaging
  • Developing aspects
  • Extensive appendices of reference data.

VIEW individual chapters

Prof. David Briggs BSc (Chem.), PhD, DSc received his degrees from the University of Durham. His career as a research scientist included 27 years with ICI plc, when he also held a number of visiting professorships, and six years as Professor of Surface Chemical Analysis at the University of Nottingham. During this time he published over 200 papers/articles and 10 books in his specialised field. In addition he was editor-in-chief of an international journal, a consultant and co-founder of a niche publishing company.

Prof. John T. Grant has extensive experience in the field of surface science, having worked in this area for over 35 years. He is an expert with the techniques used in such studies and has extensive experience in Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS or ESCA), ion bombardment of solids, sputter depth profiling, ion scattering spectroscopy (ISS), secondary ion mass spectroscopy (SIMS), scanning electron microscopy (SEM), low energy electron diffraction (LEED), ionization loss spectroscopy, soft x-ray appearance potential spectroscopy (APS), surface conductivity, surface photovoltaic effects, gas adsorption and desorption, electron beam interactions with solid surfaces, surface cleaning procedures, ultrahigh vacuum techniques, specimen preparation techniques, and controlled cleavage or fracture of specimens. He has worked with polymers, metals, semiconductors, and insulators. Dr. Grant has worked in this field in Australia, Europe, and the United States and is an internationally-recognized authority in the field of surface science. He is currently conducting research on optical coatings and nanomaterials.

  • Editors
    David Briggs and John T. Grant
  • Binding
  • Pages
  • ISBN-13
  • ISBN-10
  • Weight (g)

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