Surface Analysis

Surface Analysis

Surface analysis, in analytical chemistry, is the study of that part of a solid that is in contact with gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually reserved fro the interface between a solid and a gas or between a solid and a vacuum; the surface is considered to be that part of the solid that interacts with its environment. A surface analysis method is a technique for discovering the chemical structure of an extremely shallow and thin area called the surface number atomic layer of the solid matter. By using current surface analyzers, the elemental composition and chemical state of materials that exist only in the surface number atomic layer can be analyzed, which is not possible with other analysis methods.

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  • Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

    Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

    Individual chapters can be purchased as PDF downloads

    Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy is the first comprehensive treatment of the subject for over 10 years.

    • £180.00
  • TOF-SIMS: Materials Analysis by Mass Spectrometry 2nd Edn

    TOF-SIMS: Materials Analysis by Mass Spectrometry 2nd Edn

    Individual chapters can be purchased as PDF downloads

    In the decade following the first edition of this book, TOF-SIMS: materials analysis by Mass Spectrometry has been transformed by the adoption of heavy polyatomic or cluster primary ion sources. Lower damage rates and higher yields of analytically useful ­secondary ions have benefited all areas of application, especially in medical science, but the ability to perform depth profiling of organics has opened up entirely new possibilities. These and other advances in instrumentation and data handling/interpretation are all reflected in this completely revised edition of TOF-SIMS: Materials Analysis by Mass Spectrometry.

    • £180.00