TOF-SIMS: Materials Analysis by Mass Spectrometry 2nd Edn

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provided a powerful combination of capabilities for molecular detection and trace element determination, depth profiling, imaging in two and three dimensions, and microanalysis.

  • £180.00
  • Weight
    1700 g
  • ISBN

This is the Second Edition of the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to the instrumentation and sample handling, fundamentals and molecular dynamics simulations, optimisation methods-including laser post-ionisation of sputtered neutrals, data interpretation and analytical applications.

All the contributors are internationally recognised as leaders in their respective fields and come from both Europe, the USA and Asia.

  • Editors
    John C. Vickerman and David Briggs
  • Binding
  • Pages

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