TOF-SIMS: Materials Analysis by Mass Spectrometry 2nd Edn

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In the decade following the first edition of this book, TOF-SIMS: materials analysis by Mass Spectrometry has been transformed by the adoption of heavy polyatomic or cluster primary ion sources. Lower damage rates and higher yields of analytically useful secondary ions have benefited all areas of application, especially in medical science, but the ability to perform depth profiling of organics has opened up entirely new possibilities. These and other advances in instrumentation and data handling/interpretation are all reflected in this completely revised edition of TOF-SIMS: Materials Analysis by Mass Spectrometry.

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provided a powerful combination of capabilities for molecular detection and trace element determination, depth profiling, imaging in two and three dimensions, and microanalysis.

The Second Edition of TOF-SIMS: Materials Analysis by Mass Spectrometry is dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to the instrumentation and sample handling, fundamentals and molecular dynamics simulations, optimisation methods-including laser post- ionisation of sputtered neutrals, data interpretation and analytical applications.

All the contributors are internationally recognised as leaders in their respective fields and come from both Europe, the USA and Asia.

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Individual chapters can be purchased as PDF downloads

Prologue: ToF-SIMS—An evolving mass spectrometry of materials
John C. Vickerman

The history of Static SIMS—A personal perspective
Alfred Benninghoven

Status of cascade theory
Herbert M. Urbassek

Fundamentals of organic SIMS: insights from experiments and models
Arnaud Delcorte

Molecular speciation analysis of inorganic compounds
Luc Van Vaeck

Molecular dynamics simulations, the theoretical partner to dynamic cluster SIMS experiments
Barbara J. Garrison and Zbigniew Postawa

Birgit Hagenhoff

Laser post-ionisation—fundamentals
Andreas Wucher

Time-of-flight mass analysers
Bruno W. Schueler

Analysis beams used in ToF-SIMS
Roland Hill

Cluster and polyatomic primary ion beams
John S. Fletcher and Christopher Szakal

Molecular depth profiling
Alex Shard and Ian Gilmore

Role of operating conditions in ToF-SIMS
Ian Gilmore

Laser post-ionisation for elemental and molecular surface analysis
Nicholas P. Lockyer

Sample handling for ToF-SIMS
Fraser Reich

Qualitative interpretation of spectra
David Briggs and Ian W. Fletcher

Multivariate analysis of SIMS spectra
Alex Henderson

ToF-SIMS image analysis
Bonnie J. Tyler

Characterisation of polymeric materials
Lu-Tao Weng and Chi-Ming Chan

Functional modification of surfaces using self-assembled monlayers
Amy V. Walker

Application of SIMS to study of biological systems
Alan M Piwowar and Nicholas Winograd

Medical and biological applications of cluster beam-ToF-SIMS
David Touboul, Olivier Laprévote and Alain Brunelle

Depth profiling of inorganic materials
Ewald Niehuis and Thomas Grehl

Depth profiling in organic electronics
Ewald Niehuis

Contamination monitoring and failure analysis
Arwa Ginwalla, Thomas F. Fister and Ian A. Mowat

Photographic and digital graphic materials
Luc Van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel De Mondt, Jaymes Van Luppen and Frank Vangaever

Applications of ToF-SIMS in cosmochemistry
Thomas Stephan and Ian C. Lyon


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Prof. David Briggs BSc (Chem.), PhD, DSc received his degrees from the University of Durham. His career as a research scientist included 27 years with ICI plc, when he also held a number of visiting professorships, and six years as Professor of Surface Chemical Analysis at the University of Nottingham. During this time he published over 200 papers/articles and 10 books in his specialised field. In addition he was editor-in-chief of an international journal, a consultant and co-founder of a niche publishing company.

Prof. John Vickerman is a pioneer and international leader in the development of surface analysis by secondary ion mass spectrometry (SIMS). Building on an early career focused on basic surface chemistry and catalysis, over the last 30 years his group at the University of Manchester has made a major contribution to understanding the fundamental phenomenology and developing SIMS as a molecular mass spectrometry with the analytical power to probe chemical complexity at a level that defeats other techniques. Resulting in over 250 papers, 5 books and 50 doctoral theses, this work has contributed to the basic science of the technique, to instrumental developments and to the industrial exploitation of SIMS for applied surface analysis.

  • Editors
    John C. Vickerman and David Briggs
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  • ISBN-13

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