Welcome to IM Publications Bookshop
IM Publications Open (IMP Open) specialises in Open Access and free-to-read publishing. Our periodicals include the Open Access, peer-review Journal of Spectral Imaging (JSI), covering all areas of hyperspectral and other types of spectral imaging, and the free-to-read newsletter, TOS forum. In addition, we publish a number of print and e-books, which can be found in this store, in the fields of near infrared (NIR) spectroscopy, mass spectrometry, surface analysis, nuclear magnetic resonance (NMR), spectral imaging and a few historical titles. We also market a selection of books from other major publishers.
View our range of E-Books to purchase and download individual chapters or the complete book.
Most print titles are in stock. Orders received before 3pm (GMT) will be shipped the same day.
Recommended Titles
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A History of European Mass Spectrometry
A History of European Mass Spectrometry aims to give an insight into how some of the more important developments came about, from the advent of the first commercial instruments to the present day. The various accounts, several of which contain personal reminiscences, both provide a human background to these developments and convey the excitement of being part of the European mass spectrometry community during this period.
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Multivariate Data Analysis 6th Edition
An introduction to Multivariate Analysis, Process Analytical Technology and Quality by Design
Multivariate Data Analysis (ISBN 978-8269110401) latest edition is currently the most up-to-date resource on chemometrics and Multivariate Data Analysis. The field of chemometrics is the application of multivariate data analysis methodology to solve chemistry-based problems. It explains not only how to understand experimental outputs, but also to put this newfound knowledge into use for deeper scientific understanding or business gains.
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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
Individual chapters can be purchased as PDF downloads
Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy is the first comprehensive treatment of the subject for over 10 years.
