TOF-SIMS: Materials Analysis by Mass Spectrometry 2nd Edn
Edited by John C. Vickerman and David Briggs
In the decade following the first edition of this book, ToF-SIMS has been transformed by the adoption of heavy polyatomic or cluster primary ion sources. Lower damage rates and higher yields of analytically useful secondary ions have benefited all areas of application, especially in medical science, but the ability to perform depth profiling of organics has opened up entirely new possibilities. These and other advances in instrumentation and data handling/interpretation are all reflected in this completely revised edition.
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Edited by John C. Vickerman and David Briggs
In the decade following the first edition of this book, ToF-SIMS has been transformed by the adoption of heavy polyatomic or cluster primary ion sources. Lower damage rates and higher yields of analytically useful secondary ions have benefited all areas of application, especially in medical science, but the ability to perform depth profiling of organics has opened up entirely new possibilities. These and other advances in instrumentation and data handling/interpretation are all reflected in this completely revised edition.
Individual chapters can be purchased as PDF downloads
Prologue: ToF-SIMS—An evolving mass spectrometry of materials
John C. Vickerman
The history of Static SIMS—A personal perspective
Alfred Benninghoven
Status of cascade theory
Herbert M. Urbassek
Fundamentals of organic SIMS: insights from experiments and models
Arnaud Delcorte
Molecular speciation analysis of inorganic compounds
Luc Van Vaeck
Molecular dynamics simulations, the theoretical partner to dynamic cluster SIMS experiments
Barbara J. Garrison and Zbigniew Postawa
Cationisation
Birgit Hagenhoff
Laser post-ionisation—fundamentals
Andreas Wucher
Time-of-flight mass analysers
Bruno W. Schueler
Analysis beams used in ToF-SIMS
Roland Hill
Cluster and polyatomic primary ion beams
John S. Fletcher and Christopher Szakal
Molecular depth profiling
Alex Shard and Ian Gilmore
Role of operating conditions in ToF-SIMS
Ian Gilmore
Laser post-ionisation for elemental and molecular surface analysis
Nicholas P. Lockyer
Sample handling for ToF-SIMS
Fraser Reich
Qualitative interpretation of spectra
David Briggs and Ian W. Fletcher
Multivariate analysis of SIMS spectra
Alex Henderson
ToF-SIMS image analysis
Bonnie J. Tyler
Characterisation of polymeric materials
Lu-Tao Weng and Chi-Ming Chan
Functional modification of surfaces using self-assembled monlayers
Amy V. Walker
Application of SIMS to study of biological systems
Alan M Piwowar and Nicholas Winograd
Medical and biological applications of cluster beam-ToF-SIMS
David Touboul, Olivier Laprévote and Alain Brunelle
Depth profiling of inorganic materials
Ewald Niehuis and Thomas Grehl
Depth profiling in organic electronics
Ewald Niehuis
Contamination monitoring and failure analysis
Arwa Ginwalla, Thomas F. Fister and Ian A. Mowat
Photographic and digital graphic materials
Luc Van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel De Mondt, Jaymes Van Luppen and Frank Vangaever
Applications of ToF-SIMS in cosmochemistry
Thomas Stephan and Ian C. Lyon
Index
Prof. David Briggs BSc (Chem.), PhD, DSc received his degrees from the University of Durham. His career as a research scientist included 27 years with ICI plc, when he also held a number of visiting professorships, and six years as Professor of Surface Chemical Analysis at the University of Nottingham. During this time he published over 200 papers/articles and 10 books in his specialised field. In addition he was editor-in-chief of an international journal, a consultant and co-founder of a niche publishing company.
Prof. John Vickerman is a pioneer and international leader in the development of surface analysis by secondary ion mass spectrometry (SIMS). Building on an early career focused on basic surface chemistry and catalysis, over the last 30 years his group at the University of Manchester has made a major contribution to understanding the fundamental phenomenology and developing SIMS as a molecular mass spectrometry with the analytical power to probe chemical complexity at a level that defeats other techniques. Resulting in over 250 papers, 5 books and 50 doctoral theses, this work has contributed to the basic science of the technique, to instrumental developments and to the industrial exploitation of SIMS for applied surface analysis.
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EditorsJohn C. Vickerman and David Briggs
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BindingHardcover
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Pages732
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Weight (g)1700
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ISBN-13978-1-906715-17-5
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